產品介紹
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NTEGRA Nano IR
Ultralow drift advanced AFM-IR & s-SNOM imaging and spectroscopy
產品說明
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 NTEGRA Nano IR principal scheme |
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| NT-MDT Spectrum Instruments presents NTEGRA Nano IR - scattering scanning near-field optical microscope (s-SNOM) designed for infrared (IR) spectral range. AFM probe is located in the focus of optical system which excites sample structure by IR laser and collects the optical response. Collected light is directed to Michelson interferometer for optical analysis. |
Far-field component of the collected signal is suppressed by using lock-in techniques at cantilever oscillation frequencies. NTEGRA Nano IR system allows detection of near-field signal amplitude and phase. Spatial resolution of IR s-SNOM is about 10 nm and defined only by tip size. |
產品應用
Ultrathin films: Oligothiophene monolayers on Silicon
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| Topography (left), reflection for λ= 10.6 μm (center) and cross section of reflection signal (right). Sample courtesy to Dr. A. Mourran (DWI, Aachen, Germany). Measured by Dr. G. Andreev (EVS Co) |
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IR reflection contrast of thin and soft structures easily detectable. Each of five 3.4 nm steps is resolved. Spatial resolution is better than λ/1000.
產品規格
| Lasers and light input system Free space coupling module for easy laser source switching without realignment CO2 laser: TEC cooled, stabilized, software tunable CO2 laser, λ=10.3-10.8 μm with improved laser stability: less than +/-0.25 % variation in 30 min Tunable midIR lasers in the range 4-11 μm with Mode-Hop-Free tuning range 60 cm-1 typically Displacement free attenuators. Transmission level of 0.05, 0.12, 0.2, 0.25, 0.45
s-SNOM imaging and spectroscopy system Piezo-actuated reference mirror with closed-loop controller. Closed-loop interferometer reference arm control (tip/tilt). Enables remote optimization of the interferometer XYZ micrometer linear translation stage and piezo-stage for hot-spot alignment Low noise LN2 cooled MCT detector: <30 nV/√Hz at tapping frequency harmonics (100 kHz – 1 MHz) Modular design: all essential components are replaceable. Includes free space module, detector, beam splitter, focusing, collimating and detector lenses Controlled gas environment and temperature for highest stability and possibility to operate at IR atmospheric absorption bands Visible laser for IR beam tracking and control of optical system alignment |
AFM High-performance low noise AFM: Z-noise <0.05 nm (RMS in 10-1000 Hz bandwidth) 10 nm AFM and s-SNOM spatial resolution Low system drift – titanium head design minimize phase drift between tip and interferometer reference mirror Stable AFM performance at high temperatures: up to 150 0C with standard heating stage XYZ closed-loop sample scanner 100 x 100 x 10 μm Sample approach system. Different sample height does not require optical realignments after sample change Focus track feature: sample always stays in focus due to sample Z-feedback All standard SPM imaging modes are supported (>30 modes including KPFM, SRI, PFM, SCM) — combined with IR s-SNOM Integration with HybriD Mode™ for nanoscale stiffness and adhesion properties investigation Top viewing microscope with 1 μm spatial resolution Software Hot-spot alignment assist: field maps enable finding the absolute maximum of s-SNOM amplitude signal in minutes, with absolute certainty Oscilloscope: real time observation of amplitude and phase signals while aligning Interferometer alignment: software control of reference mirror tip/tilt. Better than 2 μRad precision for both tip and tilt Powerful export to other software (Excel, MatLab etc.) |