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Applications Notes 應用文件
SPM 原子力顯微鏡
Raman 拉曼光譜儀
FAQ 常見問題
SPM 原子力顯微鏡
Raman 拉曼光譜儀
Webinars 線上學習
2016
1.
Interplay between Raman Scattering and Atomic Force Microscopy in Characterization of Polymer Blends
2.
During semicontact measurements jumps in topography appear during the scan process, that correspond to the measured height changes abruptly by about 2 nm and the change of phase is very high too. Do you have any recommendation how to avoid this problem?
3.
Data Processing and Representation in Atomic Force Microscopy
4.
Comprehensive Compositional Imaging of Heterogeneous Materials with Atomic Force Microscopy
5.
How can I change a refresh period of an internal oscilloscope?
6.
Atomic Force Microscopy Studies of Mechanical and Electric Properties in the Contact Mode
7.
Exploring Imaging in Oscillatory Resonance AFM Modes: Backgrounds and Applications
8.
Exploring Imaging in Oscillatory Resonance AFM Modes: Backgrounds and Applications
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