AFM holds a strong positions in scientific research as is used as a routine analytical tool for physical properties characterization with high spatial resolution down to atomic level. Solver Nano is the best choice for scientists who are need a single instrument that is an affordable, robust, user-friendly and professional tool.
Why is nanotechnology interesting for education?
Cutting edge achievements in science and most successful R&D projects in commercialization are on an interdisciplinary level, combining physics – chemistry –biology - mathematics – engineering – technology - IT. The earliest, widespread description of nanotechnology refers to the particular technological goal of precisely manipulating atoms and molecules for fabrication of macroscale products. Proceeding further down to atomic scale, where no border between the scientific disciplines exist and all of them are essential for developers and scientists to understand the technological processes.
Thus using this interdisciplinary approach to the education of students provides a very effective integration and coaches graduate students to fit into an innovative national economy. Scientific projects (school science, pre- college science and etc.) allow to cope with interdisciplinary connections, develop an interdisciplinary approach, form systematically scientific thinking and learn more about modern problems of physics, chemistry, biology and nanotechnology. This is the one of the mission of STEM centers.
In the new scientific world of nanotechnology a widespread opinion persist that there are two important modern developments: the atomic force microscope (AFM) and the scanning tunnel microscopy (STM). Those are the instruments that have launched nanotechnology due to the fact that scanning probe microscopes are not limited by the wavelength of sound or light and can achieve high resolution results under a variety of environmental conditions..
HOPG atomic resolution, STM scan size 2×2 nm. Solver Nano on 100x100 um CL scanner.
SOLVER Nano is enabled for teaching principles of scanning probe microscopy and acquiring skills for studying nanoobjects and microstructures. Students can also perform all modern AFM and STM techniques with SOLVER Nano:
In Air: AFM (contact and intermittent contact), AFM spectroscopy, AFM lithography (force, current, voltage), Lateral Force Microscopy, Force Modulation Microscopy, Spreading Resistance Imaging, Piezoresponce Force Microscopy and Switching Spectroscopy, EFM, Kelvin Probe Force Microscopy, MFM, STM (microscopy, spectroscopy, lithography).
In liquid: Contact and Amplitude Modulation AFM, AFM Spectroscopy, AFM Force Lithography, Lateral Force Microscopy.
SOLVER Nano for education provides complete didactic materials for different skill levels of young aspiring scientists.
Basic level: to demonstrate various phenomena and develop skills to work on modern equipment.
Advanced level: designed for advanced studies with higher skilled students to provide insights on composite nature of modern research and interdisciplinary connections.
Research level: performed individually. Example are given on actual problems to demonstrate the structure of scientific research, form skills of designing and performing experiments, work with scientific advisers – tutors and prepare to engage in independent research.
Atomic Force Microscopy Contact AFM Constant Height mode Constant Force mode Contact Error mode Lateral Force Imaging Spreading Resistance Imaging Force Modulation microscopy Piezoresponse Force Microscopy Amplitude modulation AFM Intermittent contact mode Phase Imaging mode Semicontact Error mode Non-Contact mode Electrostatic Force Modes Contact EFM EFM Scanning Capacitance Microscopy Kelvin Probe Force Microscopy MFM DC MFM AC MFM Dissipation Force Microscopy |
AFM Spectroscopies Force-distance curves Adhesion Force imaging Amplitude-distance curves Phase-distance curves Frequency-distance curves Full-resonance Spectroscopy STM techniques Constant Current mode Constant Height mode Barrier Height imaging Density of States imaging I(z) Spectroscopy I(V) Spectroscopy Lithographies AFM Oxidation Lithography STM Lithography AFM Lithography - Scratching AFM Lithography - Dynamic Plowing HD Modes |
General specs:
Scanner | 100 x 100 x 12 um closed loop scanner, 3x3x3 um open loop scanner. |
AFM resolution | 0.01 nm. |
Environments | Air and liquid measurements. |
Combined video optical microscopes | Build in 100x optical USB microscope. External 500x optical microscope. |
Design | Table-top, affordable, robust and user-friendly |
Scanner |
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Scanning field | High voltage regime: 100x100x12 um. Low voltage regime: 3x3x3 um. |
Scanner type | Metrological piezotube XYZ scanner with sensors. |
Sensors type | XYZ – ultrafast capacitance sensors. |
Sensors noise | Low noise XY sensor: < 0.3 nm. Metrological Z sensor: < 0.03 nm. |
Sensors linearity | Metrological XY sensor: < 0.1% Metrological Z sensor: < 0.1 % |
Overall scanner parameters | 100x100x12 um with CL. Resolution: XY -0.3 nm, Z – 0.03 nm. Linearity: XY - < 0.1%, Z - < 0.1%. 3x3x3 um with OL. Resolution: XY -0.05 nm, Z – 0.01 nm. |
Sample |
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Sample positioning range | 12 mm. |
Sample positioning resolution | 1.5 um. |
Sample dimension | up to 1,5” X 1,5” X 1/2”, 35x35x12 mm |
Sample weight | up to 100 g. |
Approach system type | Z – Stepper Motor |
Approach system step size | 230 nm. |
Approach system speed rate | 10 mm per min |
Algorithm Gentle approach | Available (probe guaranteed to stop before it touches the sample) |
Scanning Heads |
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AFM head for Si cantilever | Available. All commercial cantilevers can be used |
Type of cantilever detection | Laser/Detector Alignment |
Probe holders | Probe holder for air measurements. Probe holder for liquid measurements. |
Type of AFM head mounting | Cinematically mount. Mount accuracy 150 nm. (Remove/mount accuracy) |
STM AFM head for wire probes | Available. Tungsten wire for AFM measurement. (low cost experiments) Pt|Ir wire for STM measurements. |
Type of cantilever detection | Piezo for AFM measurement. |
Probe holders | Probe holder for air and liquid measurements. |
Controllers. Digital professional controller |
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Number of images can be acquired during one scanning cycle | Up to 16 |
Image size | Up to 8Kx8K scan size |
ADC | 500 kHz 16-bit ADC 12 channels (5 channels with software controlling gain amplifiers 1,10,100,1000) Individual filter on each channel |
DSP | Floating point 320MHz DSP |
Digital FB | Yes 6 Channels |
DACs: | 4 composite DACs (3x16bit) for X,Y,Z, Bias Voltage 2 16-bit DAC for user output |
XYZ scanner control voltage | High-voltage outputs: X, -X, Y, -Y, Z, -Z at -150 V to +150 V Low-voltage mode XY ± 10 V |
XY RMS noise in 1000 Hz bandwidth | 0.3 ppm RMS |
Z RMS noise in 1000 Hz bandwidth | 0.3 ppm RMS |
XY bandwidth | 4 kHz (LV regime – 10 kHz) |
Z bandwidth | 9 kHz |
Maximal current of XY amplifiers | 1.5 mA |
Maximal current of Z amplifiers | 8 mA |
Integrated demodulator for X,Y,Z capacitive capacitance sensors | Yes |
Open/Closed-loop mode for X,Y controlх | Yes |
Generator frequency setting range | DC – 5 MHz |
Deflection registration channel bandwidth | 170 Hz-5 MHz |
Lateral Force registration channel bandwidth | 170 Hz -5 MHz |
2 additional registration channel bandwidth | 170 Hz -5 MHz |
Bias Voltage | ± 10 V bandwidth 0 – 5 MHz |
Modulating signals supply | To the probe (external output); High-voltage X,Y, Z channels (including LV regime); Bias Voltage. |
Number of generators for modulation, user accessible | 2, 0-5 MHz, 0.1 Hz resolution |
Stepper motor control outputs | Two 16-bit DACs, 20 V peak-to-peak, max current 130 mA |
Additional digital inputs/ outputs | 6 |
Additional digital outputs | 1 |
I2C bus | Yes |
Macro language | |
Max. cable length between the controller and SPM base or measuring heads | 2 m |
Computer interface | USB 2.0 |
Voltage supply | 110/220 V |
Power consumption | ≤ 110 W |
Software for SPM operation and Data processing.
Software written by programmers NT-MDT and specialized management probe microscopes and associated devices (external and build-in) and also signal and image processing obtained with SPM. This software is used to manage all SPM from NT-MDT, but adapted for each model (Next, Ntegra, Solver Nano). In the case of use with Solver Nano, the software interface as much as possible easy and user-friendly.
Operation Interface
Laser alignment
Resonance
Approach
Scan
Curves
Lithography
Tools
Data Processing and Analysis
Data presentation
Data Management
Tools
Data Processing
Data Analysis