產品介紹

Tapping Mode AFM Probe

產品說明


NC/AC/TAPPING (STANDARD) AFM PROBES
R Reflex coating: Aluminum coating for higher laser reflectance

STANDARD:

 
[fo: 320 kHz , C: 42 N/m ] 
Pointprobe® Silicon AFM Probe
 
 
[fo: 320 kHz , C: 42 N/m ] 
Pointprobe® Silicon AFM Probe
backside: reflex coating
 
  
[fo: 285 kHz , C: 42 N/m ] 
Arrow™ Silicon AFM Probe
 
 
[fo: 285 kHz , C: 42 N/m ] 
Arrow™ Silicon AFM Probe
backside: reflex coatin
 
  
[fo: 190 kHz , C: 48 N/m ] 
(long cantilever 225 µm)
Pointprobe® Silicon AFM Probe
 
 
[fo: 190 kHz , C: 48 N/m ] 
(long cantilever 225 µm)
Pointprobe® Silicon AFM Probe
backside: reflex coating

FAST-/HIGH SPEED SCANNING:

 R 
[fo: 2000 kHz ] 
Arrow™ Silicon AFM Probe, silicon cantilever
resonating with an Ultra High Frequency (UHF) of up to 2.0 MHz
backside: reflex coating
 
  
[fo: 5000 kHz , C: 30 N/m ] 
Ultra-Short Cantilever (USC) mainly dedicated to dynamic High-Speed AFM applications in air tip side: gold (tip remains uncoated) 
backside: gold
 
  
[fo: 2000 kHz , C: 3 N/m ] 
Ultra-Slhort Clantilever (USC) mainly dedicated to dynamic High-Speed AFM applications in air 
tip side: gold (tip remains uncoated) 
backside: gold
 
  
[fo: 1200 kHz , C: 7.3 N/m ] 
Ultra-Short Cantilever (USC) mainly dedicated to dynamic High-Speed AFM applications in air tip side: gold (tip remains uncoated)
backside: gold

R Reflex coating: Aluminum coating for higher laser reflectance